[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Analytical model of radiation response in FDSOI MOSFETS
McLain, Michael L., Barnaby, Hugh J., Adell, Philippe C.Year:
2008
Language:
english
Pages:
2
DOI:
10.1109/relphy.2008.4558967
File:
PDF, 299 KB
english, 2008