Comparison between performances of optical gratings and Si-PIN detectors in soft x-ray (2 - 7 keV) spectroscopy
Boscolo, A, Poletto, L, Tondello, GVolume:
6
Year:
1997
Language:
english
Pages:
1
DOI:
10.1088/0963-9659/6/1/001
File:
PDF, 89 KB
english, 1997