Ultra-Low Power Radiation Hardened by Design Memory...

Ultra-Low Power Radiation Hardened by Design Memory Circuits

Chen, Tai-Hua, Chen, Jinhui, Clark, Lawrence T., Knudsen, Jonathan E., Samson, Giby
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Volume:
54
Year:
2007
Language:
english
Pages:
8
DOI:
10.1109/tns.2007.909909
File:
PDF, 1021 KB
english, 2007
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