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[IEEE 2012 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in Rf Systems (SiRF) - Santa Clara, CA, USA (2012.01.16-2012.01.18)] 2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - A 62 GHz reflectometer for biomedical sensor readout in SiGe BiCMOS technology
Laemmle, Benjamin, Schmalz, Klaus, Scheytt, Christoph, Kissinger, Dietmar, Weigel, RobertYear:
2012
Language:
english
Pages:
4
DOI:
10.1109/sirf.2012.6160125
File:
PDF, 239 KB
english, 2012