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[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Catastrophic failure of power silicon PN junctions at high temperature induced by the surface leakage reverse current
Obreja, V.V.N., Buiu, O., Nuttall, K.I., Codreanu, C., Sung, M.L., Pei, P.Year:
2004
Language:
english
Pages:
4
DOI:
10.1109/ipfa.2004.1345587
File:
PDF, 291 KB
english, 2004