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Quantifying the dielectric constant of thick insulators by electrostatic force microscopy: effects of the microscopic parts of the probe
Gramse, G, Gomila, G, Fumagalli, LVolume:
23
Year:
2012
Language:
english
DOI:
10.1088/0957-4484/23/20/205703
File:
PDF, 1006 KB
english, 2012