Characterization of Si-doped GaAs cross-sectional surfaces...

Physical Review B 2005 Vol. 72; Iss. 8

Characterization of Si-doped GaAs cross-sectional surfaces via ab initio simulations

Duan, Xiangmei, Peressi, Maria, Baroni, Stefano
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
72
Year:
2005
Language:
english
DOI:
10.1103/physrevb.72.085341
File:
PDF, 2.78 MB
english, 2005
Conversion to is in progress
Conversion to is failed