[IEEE 53rd Electronic Components and Technology Conference, 2003. - New Orleans, Louisiana, USA (May 27-30, 2003)] 53rd Electronic Components and Technology Conference, 2003. Proceedings. - Thermal modeling and measurement of AlGaN/GaN FETs built on sapphire and SiC substrates
Jeong Park,, Kakovitch, D., Moo whan Shin,, Chin C. Lee,Year:
2003
Language:
english
Pages:
5
DOI:
10.1109/ectc.2003.1216314
File:
PDF, 546 KB
english, 2003