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[IEEE 2007 International Conference on Electrical Engineering - Lahore, Pakistan (2007.04.11-2007.04.12)] 2007 International Conference on Electrical Engineering - Factors Limiting the Device Performance in Power FLIMOSFET: 2-D Simulation Study
Vaid, R., Padha, N.Year:
2007
Language:
english
Pages:
5
DOI:
10.1109/icee.2007.4287330
File:
PDF, 2.26 MB
english, 2007