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[IEEE 2007 IEEE Symposium on VLSI Technology - Kyoto, Japan (2007.06.12-2007.06.14)] 2007 IEEE Symposium on VLSI Technology - High Performance Transistors Featured in an Aggressively Scaled 45nm Bulk CMOS Technology
Luo, Z., Rovedo, N., Ong, S., Phoong, B., Eller, M., Utomo, H., Ryou, C., Wang, H., Stierstorfer, R., Clevenger, L., Kim, S., Toomey, J., Sciacca, D., Li, J., Wille, W., Zhao, L., Teo, L., Dyer, T., FYear:
2007
Language:
english
Pages:
2
DOI:
10.1109/vlsit.2007.4339709
File:
PDF, 588 KB
english, 2007