Transgenic insect resistance traits increase corn yield and yield stability
Edgerton, Michael D, Fridgen, Jon, Anderson, John R, Ahlgrim, Jenne, Criswell, Monty, Dhungana, Prabhakar, Gocken, Tom, Li, Zheng, Mariappan, Sadayappan, Pilcher, Clinton D, Rosielle, Arnold, Stark, SVolume:
30
Language:
english
Pages:
4
Journal:
Nature Biotechnology
DOI:
10.1038/nbt.2259
Date:
June, 2012
File:
PDF, 418 KB
english, 2012