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[IEEE 2012 IEEE International Conference on Industrial Technology (ICIT 2012) - Athens (2012.03.19-2012.03.21)] 2012 IEEE International Conference on Industrial Technology - Test generation for large automotive models
Venkatesh, R., Shrotri, U., Darke, P., Bokil, P.Year:
2012
Language:
english
Pages:
6
DOI:
10.1109/icit.2012.6210014
File:
PDF, 332 KB
english, 2012