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[IEEE 2012 IEEE International Conference on Industrial Technology (ICIT 2012) - Athens (2012.03.19-2012.03.21)] 2012 IEEE International Conference on Industrial Technology - Model based testing using an Extended Context Free Grammar
Mahesh, M., Murthy, P.Year:
2012
Language:
english
Pages:
6
DOI:
10.1109/icit.2012.6210015
File:
PDF, 709 KB
english, 2012