[IEEE 2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Austin, TX, USA (2010.10.4-2010.10.6)] 2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - On the dependence of the thermal resistance on collector properties of SiGe HBTs
Korndorfer, F., Wipf, Ch.Year:
2010
Language:
english
Pages:
4
DOI:
10.1109/bipol.2010.5667991
File:
PDF, 126 KB
english, 2010