[IEEE 2010 IEEE Bipolar/BiCMOS Circuits and Technology...

  • Main
  • [IEEE 2010 IEEE Bipolar/BiCMOS Circuits...

[IEEE 2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Austin, TX, USA (2010.10.4-2010.10.6)] 2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - On the dependence of the thermal resistance on collector properties of SiGe HBTs

Korndorfer, F., Wipf, Ch.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2010
Language:
english
Pages:
4
DOI:
10.1109/bipol.2010.5667991
File:
PDF, 126 KB
english, 2010
Conversion to is in progress
Conversion to is failed