[ACM Press the 32nd ACM/IEEE International Conference - Cape Town, South Africa (2010.05.01-2010.05.08)] Proceedings of the 32nd ACM/IEEE International Conference on Software Engineering - ICSE '10 - Can clone detection support quality assessments of requirements specifications?
Juergens, Elmar, Deissenboeck, Florian, Feilkas, Martin, Hummel, Benjamin, Schaetz, Bernhard, Wagner, Stefan, Domann, Christoph, Streit, JonathanVolume:
2
Year:
2010
Language:
english
DOI:
10.1145/1810295.1810308
File:
PDF, 226 KB
english, 2010