A review of focused ion beam applications in microsystem...

A review of focused ion beam applications in microsystem technology

Reyntjens, Steve, Puers, Robert
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Volume:
11
Year:
2001
Language:
english
Pages:
14
DOI:
10.1088/0960-1317/11/4/301
File:
PDF, 2.86 MB
english, 2001
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