A Fully-Automated Electron Beam Test System for VLSI...

IEEE Design & Test of Computers 1985 Vol. 2; Iss. 5

A Fully-Automated Electron Beam Test System for VLSI Circuits

Kuji, N., Tamama, T., Yano, T.
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Volume:
2
Year:
1985
Language:
english
Pages:
9
DOI:
10.1109/mdt.1985.294820
File:
PDF, 10.17 MB
english, 1985
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