[IEEE 2010 IEEE 3rd International Nanoelectronics Conference (INEC) - Hong Kong, China (2010.01.3-2010.01.8)] 2010 3rd International Nanoelectronics Conference (INEC) - The influences of annealing process on the characteristics of 0.95 (Na0.5Bi0.5)TiO3-0.05 BaTiO3 thin films
Diao, Chien-Chen, Yang, Cheng-FuYear:
2010
Language:
english
Pages:
2
DOI:
10.1109/inec.2010.5424910
File:
PDF, 229 KB
english, 2010