![](/img/cover-not-exists.png)
X-ray beam induced current—a synchrotron radiation based technique for the in situ analysis of recombination properties and chemical nature of metal clusters in silicon
Vyvenko, O. F., Buonassisi, T., Istratov, A. A., Hieslmair, H., Thompson, A. C., Schindler, R., Weber, E. R.Volume:
91
Year:
2002
Language:
english
DOI:
10.1063/1.1450026
File:
PDF, 545 KB
english, 2002