Micromotion in trapped atom-ion systems

Physical Review A 2012 / 5 Vol. 85; Iss. 5

Micromotion in trapped atom-ion systems

Nguyên, Lê Huy, Kalev, Amir, Barrett, Murray D., Englert, Berthold-Georg
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Volume:
85
Language:
english
Pages:
1
Journal:
Physical Review A
DOI:
10.1103/physreva.85.052718
Date:
May, 2012
File:
PDF, 1.26 MB
english, 2012
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