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[ACM Press the 1st ACM workshop - Washington, DC, USA (2004.11.12-2004.11.12)] Proceedings of the 1st ACM workshop on Hardcopy document processing - HDP '04 - Low resolution character recognition by dual eigenspace and synthetic degraded patterns
Sun, Jun, Hotta, Yushinobu, Katsuyama, Yutaka, Naoi, SatoshiYear:
2004
Language:
english
Pages:
8
DOI:
10.1145/1031442.1031445
File:
PDF, 471 KB
english, 2004