[IEEE 2010 IEEE International Symposium on Electromagnetic...

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[IEEE 2010 IEEE International Symposium on Electromagnetic Compatibility - EMC 2010 - Fort Lauderdale, FL (2010.07.25-2010.07.30)] 2010 IEEE International Symposium on Electromagnetic Compatibility - An equivalent three-dipole model for IC radiated emissions based on TEM cell measurements

Siming Pan,, Jingook Kim,, Sungnam Kim,, Jaesu Park,, Heoncheol Oh,, Jun Fan,
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Year:
2010
Language:
english
Pages:
5
DOI:
10.1109/isemc.2010.5711354
File:
PDF, 2.67 MB
english, 2010
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