A line-broadening analysis model for the microstructural characterization of nanocrystalline materials from asymmetric x-ray diffraction peaks
Pantoja-Cortés, Juan, Sánchez-Bajo, Florentino, Ortiz, Angel LVolume:
24
Year:
2012
Language:
english
DOI:
10.1088/0953-8984/24/21/215301
File:
PDF, 634 KB
english, 2012