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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - LEAP: Layout Design through Error-Aware Transistor Positioning for soft-error resilient sequential cell design
Hsiao-Heng Kelin, Lee, Klas, Lilja, Mounaim, Bounasser, Prasanthi, Relangi, Linscott, Ivan R., Inan, Umran S., Subhasish, MitraYear:
2010
Language:
english
Pages:
10
DOI:
10.1109/irps.2010.5488829
File:
PDF, 2.13 MB
english, 2010