AIP Conference Proceedings [AIP THE 10TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY - Chicago, Illinois, (USA) (15–20 August 2010)] - X-ray Grating Interferometry at ESRF: Applications and Recent Technical Developments
Weitkamp, T., Zanette, I., Schulz, G., Bech, M., Rutishauser, S., Lang, S., Donath, T., Tapfer, A., Deyhle, H., Bernard, P., Valade, J.-P., Reznikova, E., Kenntner, J., Mohr, J., Müller, B., PfeifferYear:
2011
Language:
english
Pages:
4
DOI:
10.1063/1.3625297
File:
PDF, 2.36 MB
english, 2011
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