Interface Analysis of Embedded Chip Resistor Device Package...

Journal of Nanoscience and Nanotechnology 2012 / 04 Vol. 12; Iss. 4

Interface Analysis of Embedded Chip Resistor Device Package and Its Effect on Drop Shock Reliability

Park, Se-Hoon, Kim, Sun Kyoung, Kim, Young-Ho
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Volume:
12
Language:
english
Pages:
5
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2012.5613
Date:
April, 2012
File:
PDF, 983 KB
english, 2012
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