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[IEEE 2011 IEEE 14th International Multitopic Conference (INMIC) - Karachi, Pakistan (2011.12.22-2011.12.24)] 2011 IEEE 14th International Multitopic Conference - Impact of business intelligence competency center in success/ failure of B.I. applications
Safeer, Muhammad, Zafar, SalmanYear:
2011
Language:
english
Pages:
6
DOI:
10.1109/inmic.2011.6151486
File:
PDF, 530 KB
english, 2011