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[IEEE Proceedings of 17th Annual Electrical Overstress/Electrostatic Discharge Symposium - Phoenix, AZ, USA (1995.09.12-1995.09.14)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings - Analysis of snubber-clamped diode-string mixed voltage interface ESD protection network for advanced microprocessors
Voldman, S.H., Gerosa, G., Gross, V.P., Dickson, N., Furkay, S., Slinkman, J.Year:
1995
Language:
english
Pages:
19
DOI:
10.1109/eosesd.1995.478267
File:
PDF, 1.61 MB
english, 1995