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[IEE 8th International Conference on Power Electronics and Variable Speed Drives - London, UK (18-19 Sept. 2000)] 8th International Conference on Power Electronics and Variable Speed Drives - Test and characterisation of modern fast recovery diodes for high speed switching applications
Rahimo, M.T.Volume:
2000
Year:
2000
Language:
english
Pages:
6
DOI:
10.1049/cp:20000228
File:
PDF, 566 KB
english, 2000