Trade-Offs Between RF Performance and Total-Dose Tolerance in 45-nm RF-CMOS
Arora, Rajan, Zhang, En Xia, Seth, Sachin, Cressler, John D., Fleetwood, Daniel M., Schrimpf, Ronald D., Rosa, Giuseppe L., Sutton, Akil K., Nayfeh, Hasan M., Freeman, GregVolume:
58
Year:
2011
Language:
english
Pages:
8
DOI:
10.1109/tns.2011.2167518
File:
PDF, 1.47 MB
english, 2011