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Characterization and Modeling of Parasitic Field-Oxide Transistors for Use in Radiation Hardening by Design
Schlenvogt, Garrett J., Barnaby, Hugh J., Rollins, Jeff D., Wilkinson, Jeff, Morrison, Scott, Tyler, LarryVolume:
58
Year:
2011
Language:
english
Pages:
8
DOI:
10.1109/tns.2011.2169427
File:
PDF, 3.39 MB
english, 2011