Characterization and Modeling of Parasitic Field-Oxide...

IEEE Transactions on Nuclear Science 2011 Vol. 58; Iss. 6

Characterization and Modeling of Parasitic Field-Oxide Transistors for Use in Radiation Hardening by Design

Schlenvogt, Garrett J., Barnaby, Hugh J., Rollins, Jeff D., Wilkinson, Jeff, Morrison, Scott, Tyler, Larry
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
58
Year:
2011
Language:
english
Pages:
8
DOI:
10.1109/tns.2011.2169427
File:
PDF, 3.39 MB
english, 2011
Conversion to is in progress
Conversion to is failed