Determination of the Deposition Order of Overlapping Latent...

Determination of the Deposition Order of Overlapping Latent Fingerprints and Inks Using Secondary Ion Mass Spectrometry

Bright, Nicholas J., Webb, Roger P., Bleay, Stephen, Hinder, Steven, Ward, Neil I., Watts, John F., Kirkby, Karen J., Bailey, Melanie J.
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Volume:
84
Year:
2012
Language:
english
Pages:
5
DOI:
10.1021/ac300185j
File:
PDF, 3.97 MB
english, 2012
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