Intrinsic ultrathin topological insulators grown via...

Intrinsic ultrathin topological insulators grown via molecular beam epitaxy characterized by in-situ angle resolved photoemission spectroscopy

Lee, J. J., Schmitt, F. T., Moore, R. G., Vishik, I. M., Ma, Y., Shen, Z. X.

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Volume:

101

Year:

2012

Language:

english

Journal:

Applied Physics Letters

DOI:

10.1063/1.4733317

File:

PDF, 2.33 MB

english, 2012

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