X-ray diffraction profiles from axial nanowire...

Physical Review B 2011 Vol. 83; Iss. 24

X-ray diffraction profiles from axial nanowire heterostructures

Kaganer, V., Wölz, M., Brandt, O., Geelhaar, L., Riechert, H.
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Volume:
83
Year:
2011
Language:
english
DOI:
10.1103/physrevb.83.245321
File:
PDF, 415 KB
english, 2011
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