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[IEEE 2011 IEEE AUTOTESTCON - Baltimore, MD, USA (2011.09.12-2011.09.15)] 2011 IEEE AUTOTESTCON - Analyzing artifacts in the time domain waveform to locate wire faults
Parkey, Charna, Hughes, Craig, Locken, NicholasYear:
2011
Language:
english
Pages:
5
DOI:
10.1109/autest.2011.6058771
File:
PDF, 785 KB
english, 2011