[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Characterization of multi-bit soft error events in advanced SRAMs
Maiz, J., Hareland, S., Zhang, K., Armstrong, P.Year:
2003
Language:
english
Pages:
1
DOI:
10.1109/iedm.2003.1269335
File:
PDF, 263 KB
english, 2003