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Effects of traps on charge storage characteristics in metal-oxide-semiconductor memory structures based on silicon nanocrystals
Shi, Yi, Saito, Kenichi, Ishikuro, Hiroki, Hiramoto, ToshiroVolume:
84
Year:
1998
Language:
english
DOI:
10.1063/1.368346
File:
PDF, 304 KB
english, 1998