Statistical process monitoring approach for high-density...

Journal of Intelligent Manufacturing 2013 / 12 Vol. 24; Iss. 6

Statistical process monitoring approach for high-density point clouds

Wells, Lee J., Megahed, Fadel M., Niziolek, Cory B., Camelio, Jaime A., Woodall, William H.
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Volume:
24
Language:
english
Pages:
13
Journal:
Journal of Intelligent Manufacturing
DOI:
10.1007/s10845-012-0665-2
Date:
December, 2013
File:
PDF, 712 KB
english, 2013
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