Thermal stability and electrical conduction behavior of...

Journal of Applied Physics 1988 Vol. 64; Iss. 1

Thermal stability and electrical conduction behavior of coevaporated WSi2±x thin films

Nava, F., Weiss, B. Z., Ahn, K. Y., Smith, D. A., Tu, K. N.
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Volume:
64
Year:
1988
Language:
english
DOI:
10.1063/1.341435
File:
PDF, 1.49 MB
english, 1988
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