Crystallographic study of semi‐insulating polycrystalline...

Crystallographic study of semi‐insulating polycrystalline silicon (SIPOS) doped with oxygen atoms

Hamasaki, M., Adachi, T., Wakayama, S., Kikuchi, M.
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Volume:
49
Year:
1978
Language:
english
DOI:
10.1063/1.325356
File:
PDF, 704 KB
english, 1978
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