SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San...

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SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California (Sunday 21 August 2011)] Optical Trapping and Optical Micromanipulation VIII - Back-focal-plane interferometry: position or force detection?

Farré, Arnau, Martín-Badosa, Estela, Montes-Usategui, Mario, Dholakia, Kishan, Spalding, Gabriel C.
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Volume:
8097
Year:
2011
Language:
english
Pages:
1
DOI:
10.1117/12.893307
File:
PDF, 4.55 MB
english, 2011
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