Minimizing image-processing artifacts in scanning tunneling...

Review of Scientific Instruments 2006 Vol. 77; Iss. 12

Minimizing image-processing artifacts in scanning tunneling microscopy using linear-regression fitting

Fogarty, Daniel P., Deering, Amanda L., Guo, Song, Wei, Zhongqing, Kautz, Natalie A., Kandel, S. Alex
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Volume:
77
Year:
2006
Language:
english
DOI:
10.1063/1.2390633
File:
PDF, 611 KB
english, 2006
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