In-Situ Probe of Gate Dielectric-Semiconductor Interfacial...

Journal of the American Chemical Society 2012 / 07 Vol. 134; Iss. 28

In-Situ Probe of Gate Dielectric-Semiconductor Interfacial Order in Organic Transistors: Origin and Control of Large Performance Sensitivities

Walter, Stephanie R., Youn, Jangdae, Emery, Jonathan D., Kewalramani, Sumit, Hennek, Jonathan W., Bedzyk, Michael J., Facchetti, Antonio, Marks, Tobin J., Geiger, Franz M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
134
Language:
english
Pages:
8
Journal:
Journal of the American Chemical Society
DOI:
10.1021/ja3036493
Date:
July, 2012
File:
PDF, 1.89 MB
english, 2012
Conversion to is in progress
Conversion to is failed