[IEEE 2011 IEEE Radiation Effects Data Workshop (in...

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[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - A Summary of Single Event Upset Testing of CD4000 Series Devices

Lombardi, Robert E., Bogorad, Alexander L., Likar, Justin J., Rubin, Aaron S., Camacho, Carlos F.
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Year:
2010
Language:
english
Pages:
4
DOI:
10.1109/redw.2010.6062505
File:
PDF, 206 KB
english, 2010
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