[IEEE 2012 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in Rf Systems (SiRF) - Santa Clara, CA, USA (2012.01.16-2012.01.18)] 2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Compact modeling based extraction of RF noise in SiGe HBT terminal currents
Xu, Ziyan, Niu, GuofuYear:
2012
Language:
english
Pages:
4
DOI:
10.1109/sirf.2012.6160162
File:
PDF, 271 KB
english, 2012