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[IEEE 2004 IEEE MTT-S International Microwave Symposium Digest - Fort Worth, TX, USA (6-11 June 2004)] 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) - Thermal resistance calculation of AlGaN/GaN on SiC devices
Darwish, A.M., Bayba, A., Hung, H.A.Year:
2004
Language:
english
Pages:
4
DOI:
10.1109/mwsym.2004.1339014
File:
PDF, 355 KB
english, 2004