[IEEE 2012 13th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - San Diego, CA, USA (2012.05.30-2012.06.1)] 13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems - A novel method to rapidly determine the key properties of thermoelectric devices
En-Ting Chu,, Heng-Chieh Chien,, Huey-Lin Hsieh,, Jing-Yi Huang,, Chun-Kai Liu,, Da-Jeng Yao,Year:
2012
Language:
english
Pages:
6
DOI:
10.1109/itherm.2012.6231418
File:
PDF, 1.23 MB
english, 2012