Phase-change random access memory: A scalable technology
Raoux, S., Burr, G. W., Breitwisch, M. J., Rettner, C. T., Chen, Y.-C., Shelby, R. M., Salinga, M., Krebs, D., Chen, S.-H., Lung, H.-L., Lam, C. H.Volume:
52
Year:
2008
Language:
english
Pages:
15
DOI:
10.1147/rd.524.0465
File:
PDF, 661 KB
english, 2008