[IEEE 2006 IEEE Instrumentation and Measurement Technology - Sorrento, Italy (2006.04.24-2006.04.27)] 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings - Two Time-Interleaved ADC Channel Structure: Analysis and Modeling
Jridi, M., Monnerie, G., Bossuet, L., Dallet, D.Year:
2006
Language:
english
Pages:
5
DOI:
10.1109/imtc.2006.328182
File:
PDF, 216 KB
english, 2006