[IEEE 2006 IEEE Instrumentation and Measurement Technology...

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[IEEE 2006 IEEE Instrumentation and Measurement Technology - Sorrento, Italy (2006.04.24-2006.04.27)] 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings - Two Time-Interleaved ADC Channel Structure: Analysis and Modeling

Jridi, M., Monnerie, G., Bossuet, L., Dallet, D.
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Year:
2006
Language:
english
Pages:
5
DOI:
10.1109/imtc.2006.328182
File:
PDF, 216 KB
english, 2006
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