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SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Measurement of low loss and mirrors' reflectivity using cavity ring down spectroscopy with high accuracy
Yang, Dexing, Jiang, Yajun, Zhao, Jianlin, Di, Nan, Hou, Xun, Yuan, Jiahu, Wyant, James C., Wang, Hexin, Han, SenVolume:
6150
Year:
2006
Language:
english
Pages:
1
DOI:
10.1117/12.677964
File:
PDF, 392 KB
english, 2006